1.0SAKI Corporationhttps://www.sakicorp.com/enfujiwarahttps://www.sakicorp.com/en/author/fujiwara/rich600338<blockquote class="wp-embedded-content" data-secret="fs1PRcbTYP"><a href="https://www.sakicorp.com/en/news/newsrelease/1943/">Saki Demonstrates Advanced 3D AOI Capabilities at NEPCON China in Booth 1J25</a></blockquote><iframe sandbox="allow-scripts" security="restricted" src="https://www.sakicorp.com/en/news/newsrelease/1943/embed/#?secret=fs1PRcbTYP" width="600" height="338" title="“Saki Demonstrates Advanced 3D AOI Capabilities at NEPCON China in Booth 1J25” — SAKI Corporation" data-secret="fs1PRcbTYP" frameborder="0" marginwidth="0" marginheight="0" scrolling="no" class="wp-embedded-content"></iframe><script> /*! This file is auto-generated */ !function(d,l){"use strict";l.querySelector&&d.addEventListener&&"undefined"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!/[^a-zA-Z0-9]/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret="'+t.secret+'"]'),o=l.querySelectorAll('blockquote[data-secret="'+t.secret+'"]'),c=new RegExp("^https?:$","i"),i=0;i<o.length;i++)o[i].style.display="none";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute("style"),"height"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):"link"===t.message&&(r=new URL(s.getAttribute("src")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener("message",d.wp.receiveEmbedMessage,!1),l.addEventListener("DOMContentLoaded",function(){for(var e,t,s=l.querySelectorAll("iframe.wp-embedded-content"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute("data-secret"))||(t=Math.random().toString(36).substring(2,12),e.src+="#?secret="+t,e.setAttribute("data-secret",t)),e.contentWindow.postMessage({message:"ready",secret:t},"*")},!1)))}(window,document); </script> Extra Component Detection Algorithm Helps Eliminate Defects Fremont, CA – 13 April 2017 – Saki Corporation, an innovator in the field of automated optical inspection equipment, will demonstrate the advanced capabilities and new extra component detection (ECD) feature of its BF-3Di 3D automated optical inspection (AOI) systems at NEPCON China on April 25-27, 2017 at the Shanghai World EXPO Exhibition & Convention Center in Shanghai, China, in booth 1J25. Saki’s ECD algorithm inspects for stray components, solder balls, and foreign materials across the entire surface of the circuit board and can detect objects of 200 microns or less, thereby eliminating these defects. ECD, coupled with the benefits of the complete scan of the PCB by Saki’s line scan technology, provides further assurance...https://www.sakicorp.com/en/wp-content/uploads/sites/2/2025/09/og_saki_logo-768x432-1.png768432